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Volumn 465, Issue 1-2, 2008, Pages 340-343

Thermal stability of GaN powders investigated by XRD, XPS, PL, TEM, and FT-IR

Author keywords

Annealing; Ga metal; GaN powders; Thermal stability

Indexed keywords

ANNEALING; CRYSTALLINE MATERIALS; CRYSTALS; DIFFRACTION; FOURIER TRANSFORMS; GALLIUM ALLOYS; GALLIUM COMPOUNDS; GALLIUM NITRIDE; INFRARED SPECTROSCOPY; LIGHT EMISSION; LUMINESCENCE; METALS; MOLECULAR ORBITALS; MOLECULAR SPECTROSCOPY; NITRIDES; NITROGEN; NONMETALS; PHOTODEGRADATION; PHOTOELECTRON SPECTROSCOPY; POWDER METALS; POWDERS; SEMICONDUCTING GALLIUM; SULFATE MINERALS; SURFACE DEFECTS; THERMODYNAMIC STABILITY; X RAY ANALYSIS; X RAY DIFFRACTION ANALYSIS;

EID: 50149092212     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2007.10.084     Document Type: Article
Times cited : (18)

References (24)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.