Thermal oxidation behaviors of GaN powders

Materials Letters

Volumn 59, Issue 29-30, 2005, Pages 4041-4043

  Xiao, Hong Di ^a   Ma, Hong Lei ^a   Xue, Cheng Shan ^b   Zhuang, Hui Zhao ^b   Ma, Jin ^a   Zong, Fu Jian ^a   Hu, Wen Rong ^a  

^a SHANDONG UNIVERSITY   (China)

^b SHANDONG NORMAL UNIVERSITY   (China)

Author keywords

Ga2O 3; GaN; Thermal annealing; Thermal oxidation behaviors

Indexed keywords

ANNEALING; DIFFERENTIAL THERMAL ANALYSIS; FOURIER TRANSFORM INFRARED SPECTROSCOPY; POWDERS; THERMOANALYSIS; THERMOGRAVIMETRIC ANALYSIS; THERMOOXIDATION; X RAY DIFFRACTION;

GA2O3; GALLIUM OXIDE; THERMAL ANNEALING; THERMAL OXIDATION BEHAVIOR;

GALLIUM NITRIDE;

EID: 26844553745     PISSN: 0167577X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matlet.2005.07.061     Document Type: Article

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