Exploiting correlation kernels for efficient handling of intra-die spatial correlation, with application to statistical timing

Proceedings -Design, Automation and Test in Europe, DATE

Volumn , Issue , 2008, Pages 856-861

  Singhee, Amith ^a   Singhal, Sonia ^a   Rutenbar, Rob A ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CLUSTER ANALYSIS; CORRELATION METHODS; DIES; ERROR ANALYSIS; INDUSTRIAL ENGINEERING; NUMERICAL METHODS; PARAMETER ESTIMATION; RANDOM ERRORS; RANDOM VARIABLES; STANDARDS; STATIC ANALYSIS; STATISTICAL METHODS; TESTING; TIME MEASUREMENT;

CAD TOOLS; DIE MANUFACTURING; GALERKIN TECHNIQUE; MEASUREMENT COSTS; MODEL PARAMETERS; MONTE CARLO; NANO SCALING; PRACTICAL USE; SPATIAL CORRELATION; STATISTICAL STATIC TIMING ANALYSIS; STATISTICAL TIMING;

COMPUTER AIDED DESIGN;

EID: 49749140706     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DATE.2008.4484781     Document Type: Conference Paper

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