Analysis and verification of power grids considering process-induced leakage-current variations

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn 25, Issue 1, 2006, Pages 126-143

  Ferzli, I A ^a   Najm, F N ^a  

^a UNIVERSITY OF TORONTO   (Canada)

Author keywords

Grid voltage drops; Integrated circuits; Leakage current; Lognormal distribution; Monte Carlo method; Power grid analysis; Power grid verification; Process induced leakage current variations; Transistor threshold voltage; Voltage drop variances

Indexed keywords

COMPUTER SIMULATION; ELECTRIC POWER SYSTEMS; INTEGRATED CIRCUITS; MATHEMATICAL MODELS; MONTE CARLO METHODS; THRESHOLD VOLTAGE; TRANSISTORS;

GRID VOLTAGE DROPS; LOGNORMAL DISTRIBUTION; POWER GRID ANALYSIS; POWER GRID VERIFICATION; PROCESS-INDUCED LEAKAGE-CURRENT VARIATIONS; TRANSISTOR THRESHOLD VOLTAGE; VOLTAGE-DROP VARIANCES;

LEAKAGE CURRENTS;

EID: 31344463487     PISSN: 02780070     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCAD.2005.852665     Document Type: Article

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