Closed-Form Expressions for Extending Step Delay and Slew Metrics to Ramp Inputs for RC Trees

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn 23, Issue 4, 2004, Pages 509-516

  Kashyap, Chandramouli V ^a   Alpert, Charles J ^b   Liu, Frank ^b   Devgan, Anirudh ^b  

^a Flexlogics Inc   (United States)

^b IBM   (United States)

Author keywords

Delay metric; Elmore; Input slew; Mean; Median; Moments; Probability distribution function (pdf); Ramp inputs; Resistence capacitance (rc) trees; Slew metric; Standard deviation

Indexed keywords

APPLICATION SPECIFIC INTEGRATED CIRCUITS; CAPACITANCE; ELECTRIC EXCITATION; ELECTRIC RESISTANCE; INTEGRATED CIRCUIT LAYOUT; PROBABILITY DISTRIBUTIONS;

DELAY METRICS; ELMORE DELAY; INPUT SLEW; PROBABILITY DISTRIBUTION FUNCTION (PDF); RAMP INPUTS; RESISTANCE-CAPACITANCE (RC) TREES; SLEW METRIC; STANDARD DEVIATION;

DELAY CIRCUITS;

EID: 2342420714     PISSN: 02780070     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCAD.2004.825861     Document Type: Conference Paper

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