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Volumn , Issue , 2008, Pages 43-46

Process variation aware bus-coding scheme for delay minimization in VLSI interconnects

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONICS ENGINEERING; INTERCONNECTION NETWORKS;

EID: 49749107072     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISQED.2008.4479695     Document Type: Conference Paper
Times cited : (8)

References (13)
  • 2
    • 4444264520 scopus 로고    scopus 로고
    • Novel Sizing Algorithm for Yield Improvement under Process Variation in Nanometer Technology
    • Seung Hoon Choi, Bipul C. Paul and Kaushik Roy, "Novel Sizing Algorithm for Yield Improvement under Process Variation in Nanometer Technology," in the proceedings of DAC'04, pp 454-459, 2004.
    • (2004) proceedings of DAC'04 , pp. 454-459
    • Hoon Choi, S.1    Paul, B.C.2    Roy, K.3
  • 7
    • 43749110041 scopus 로고    scopus 로고
    • Effects of Interconnect Process Variations on Signal Integrity
    • Sep
    • Ertugrul Demircan, "Effects of Interconnect Process Variations on Signal Integrity," in IEEE International SOC Conference, Sep. 2006.
    • (2006) IEEE International SOC Conference
    • Demircan, E.1
  • 9
    • 49749123728 scopus 로고    scopus 로고
    • Predictive Technology Model (PTM), Nanoscale Integration and Modeling (NIMO) Group, Arizona State University (ASU). URL: http://www.eas.asu.edu/ ∼ptm/interconnect.html.
    • Predictive Technology Model (PTM), Nanoscale Integration and Modeling (NIMO) Group, Arizona State University (ASU). URL: http://www.eas.asu.edu/ ∼ptm/interconnect.html.
  • 10
    • 84860357717 scopus 로고    scopus 로고
    • Models of Process Variations in Device and Interconnect
    • A. Chandrakasan, W. Bowhill, and F. Fox, Eds. New York, USA: IEEE Press, ch. 6, pp
    • D. Boning and S. Nassif, "Models of Process Variations in Device and Interconnect," in Design of High-Performance Microprocessors Circuits, A. Chandrakasan, W. Bowhill, and F. Fox, Eds. New York, USA: IEEE Press, 2000, ch. 6, pp. 98-115.
    • (2000) Design of High-Performance Microprocessors Circuits , pp. 98-115
    • Boning, D.1    Nassif, S.2
  • 11
    • 49749147780 scopus 로고    scopus 로고
    • Muroyama. M, Tarumi. K, Makiyama. K, Yasuura.H, A variation-aware low-power coding methodology for tightly coupled buses in proceedings of ASP-DAC'05, pp. 557-60.
    • Muroyama. M, Tarumi. K, Makiyama. K, Yasuura.H, "A variation-aware low-power coding methodology for tightly coupled buses" in proceedings of ASP-DAC'05, pp. 557-60.
  • 12
    • 0034483941 scopus 로고    scopus 로고
    • Miller Factor for Gate-Level Coupling Delay Calculation
    • NOV
    • P. Chen, D. A. Kirkpatrick, K. Kcutzer, "Miller Factor for Gate-Level Coupling Delay Calculation," in. Proceedings of ICCAD'00, pp.68-74, NOV. 2000.
    • (2000) Proceedings of ICCAD'00 , pp. 68-74
    • Chen, P.1    Kirkpatrick, D.A.2    Kcutzer, K.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.