Characterization of microstructure and defects in epitaxial ZnO (1 1 over(2, -) 0) films on Al2O3(1 over(1, -) 0 2) substrates by transmission electron microscopy

Journal of Crystal Growth

Volumn 310, Issue 18, 2008, Pages 4102-4109

  Lee, Jae Wook ^a   Han, Seok Kyu ^b   Hong, Soon Ku ^b   Lee, Jeong Yong ^a   Yao, Takafumi ^c  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

^b Chungnam National University   (South Korea)

^c TOHOKU UNIVERSITY   (Japan)

Author keywords

A1. Characterization; A1. Defects; A3. Molecular beam epitaxy; B1. Zinc compounds; B2. Semiconducting II VI materials

Indexed keywords

ALUMINUM; MICROSTRUCTURE; MOLECULAR BEAM EPITAXY; SEMICONDUCTING ZINC COMPOUNDS; ZINC ALLOYS; ZINC OXIDE;

A1. CHARACTERIZATION; A1. DEFECTS; A3. MOLECULAR BEAM EPITAXY; B1. ZINC COMPOUNDS; B2. SEMICONDUCTING II-VI MATERIALS; NON-POLAR; TRANSMISSION ELECTRON; ZNO FILMS;

EPITAXIAL FILMS;

EID: 49749102769     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2008.06.042     Document Type: Article

References (20)

1. Bagnall D.M., Chen Y.F., Zhu Z., Koyama S., Shen M.Y., Goto T., and Yao T. Appl. Phys. Lett. 70 (1997) 2230
2. Makino T., Tamura K., Chia C.H., Segawa Y., Kawasaki M., Ohtomo A., and Koinuma H. Appl. Phys. Lett. 81 (2002) 2355
3. Morhain C., Tang X., Teisserie-Doninelli M., Lo B., Laügt M., Chauveau J.-M., Vinter B., Tottereau O., Vennéguès P., Deparis C., and Neu G. Superlattices Microstructures 38 (2005) 455
4. Makino T., Ohtomo A., Chia C.H., Segawa Y., Koinuma H., and Kawasaki M. Physica E 21 (2004) 671
5. Guillet T., Bretagnon T., Taliercio T., Lefebvre P., Gil B., Morhain C., and Tang X. Superlattices Microstructures 41 (2007) 352
6. Zhang B.P., Liu B.L., Yu J.Z., Wang Q.M., Liu C.Y., Liu Y.C., and Segawa Y. Appl. Phys. Lett. 90 (2007) 132113
7. Zúñiga-Pérez J., Muñoz-Sanjosé V., Palacios-Lidón E., and Colchero J. Appl. Phys. Lett. 88 (2006) 261912
8. Moriyama T., and Fujita S. Jpn. J. Appl. Phys. 44 (2005) 7919
9. Yamauchi S., Handa H., Nagayama A., and Hariu T. Thin Solid Films 345 (1999) 12
10. Han S.K., Hong S.K., Lee J.W., Lee J.Y., Song J.H., Nam Y.S., Chang S.K., Minegishi T., and Yao T. J. Crystal Growth 309 (2007) 121
11. Craven M.D., Lim S.H., Wu F., Speck J.S., and DenBaars S.P. Appl. Phys. Lett. 81 (2002) 469
12. Haskell B.A., Wu F., Matsuda S., Craven M.D., Fini P.T., DenBaars S.P., Speck J., and Nakamura S. Appl. Phys. Lett. 83 (2003) 1554
13. Lim S.H. J. Vac. Sci. Technol. A 24 (2006) 264
14. Lim S.H., and Shindo D. J. Appl. Phys. 88 (2000) 5107
15. Zakharov D.N., Liliental-Weber Z., Wagner B., Reitmeier Z.J., Preble E.A., and Davis R.F. Phys. Rev. B 71 (2005) 235334
16. Romanov A.E., Pompe W., Beltz G.E., and Speck J.S. Appl. Phys. Lett. 69 (1996) 3342
17. Zheleva T., Jagannadham K., and Narayan J. J. Appl. Phys. 75 (1994) 860
18. Dovidenko K., Oktyabrsky S., and Narayan J. J. Appl. Phys. 82 (1997) 4296
19. Gerthsen D., Litvinov D., Gruber Th., Kirchner C., and Waag A. Appl. Phys. Lett. 81 (2002) 3972
20. Amelinckx S. In: Nabarro F.R.N. (Ed). Dislocations in Solids 2 (1979), North-Holland Publishing Company, Amsterdam 88