Investigation of micro-adhesion by atomic force microscopy

Applied Surface Science

Volumn 169-170, Issue , 2001, Pages 644-648

  Ouyang, Q ^a   Ishida, K ^a   Okada, K ^a  

^a UNIVERSITY OF YAMANASHI   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTROSTATICS; INTERFACES (MATERIALS); VAN DER WAALS FORCES;

CAPILLARY FORCES; MICRO-ADHESIVES;

ADHESIVES;

EID: 17444450728     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(00)00804-7     Document Type: Article

References (19)

1. B. Bhushan, Handbook of Micro/Nano Tribology, CRC Press, Boca Raton, FL, 1995, p. 5.
2. I.L. Singer, H.M. Pollock, Fundamentals of Friction: Microscopic and Microscopic Processes, Kluwer Academic Publishers, Dordrecht, 1992, p. 80, 351.
3. D. Michel, S. Kopp-Marsaudon, J.P. Aim, Tribol. Lett. 4 (1998) 1, 81.
4. M. Ruths, H. Ohtani, M. Greenfield, S. Granick, Tribol. Lett. 6 (1999) 3, 4, 207-214.
5. Liu X., Chetwynd D.G., Gardner J.W., Bartlett P.N., Beriet C. Tribol. Int. 31:1998;313.
6. Scherge M., Li X., Schaefer J.A. Tribol. Lett. 6:1999;215.
7. Binggeli M., Mate C.M. J. Vac. Sci. Technol. B13:1995;1321.
8. Israelachvili J.N., Tabor D. Proc. R. Soc. a. 331:1972;19.
9. Hays D.A. J. Chem. Phy. 61:1975;1455.
10. Liu C.Y., Tu K.N. Phys. Rev. 58:1998;6308.
11. Ouyang Q., Okada K. Appl. Surf. Sci. 78:1994;309.
12. Suzuki H., Mashiko S. Thin Solid Films. 331:1998;176.
13. Barrena E., Kopta S., Ogletree D.F., Charych D.H., Salmeron M. Phys. Rev. Lett. 82(14):1999;2880.
14. Lowell J. J. Phys. D: Appl. Phys. 8:1975;53.
15. Fujisawa S., Kishi E., Sugawara Y., Morita S. Phys. Rev. B51:1995;7857.
16. Taylor D.M. Thin Solid Films. 331:1998;1.
17. Luth R., Meyer E., Haefke H., Howald L., Gutmannsbauer W., Guntherodt H.J. Science. 266:1994;1979.
18. Sumomogi T., Ieda K.H., Endo T., Kuwahara K. Appl. Phys. A. 66:1998;299.
19. Miyamoto T., Kaneko R., Ando Y. J. Tribol. 112:1990;567.