Application of optical and luminescent techniques to the characterization of oxide thin films

Applied Surface Science

Volumn 252, Issue 15, 2006, Pages 5590-5593

  Hao, J H ^a,b   Gao, J ^a  

^a UNIVERSITY OF HONG KONG   (Hong Kong)

^b HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

Author keywords

Characterization; Luminescence; Oxide thin films; Photoconductivity; Trap

Indexed keywords

CARRIER TRANSMISSION ON POWER LINES; CHARACTERIZATION; ELECTRONS; LUMINESCENCE; PHOTOCONDUCTIVITY; RELAXATION PROCESSES;

LUMINESCENT TECHNIQUES; OXIDE THIN FILMS; PHOTOCONDUCTIVITY RELAXATION; TRAP;

THIN FILMS;

EID: 33746787654     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2005.12.135     Document Type: Article

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