Characterization of the oxidized indium thin films with thermal oxidation

Thin Solid Films

Volumn 279, Issue 1-2, 1996, Pages 1-3

  Lee, Min Suk ^a   Choi, Won Chel ^a,b   Kim, Eun Kyu ^a   Kim, Chun Keun ^a   Min, Suk Ki ^a  

^a Korea Institute of Science and Technology   (South Korea)

^b Sungkyunkwan University   (South Korea)

Author keywords

Indium; Oxidation; Thermal oxidation

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; CHARACTERIZATION; CRYSTAL STRUCTURE; DEPOSITION; GRAIN SIZE AND SHAPE; INDIUM COMPOUNDS; OXIDATION; PHOTOLUMINESCENCE; SCANNING ELECTRON MICROSCOPY; SECONDARY ION MASS SPECTROMETRY; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY;

ORANGE PHOTOLUMINESCENCE; OXIDIZED INDIUM THIN FILMS; THERMAL OXIDATION;

THIN FILMS;

EID: 0030173578     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/0040-6090(96)08742-1     Document Type: Article

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