Spatial analysis of time of flight-secondary ion mass spectrometric images by ordinary kriging and inverse distance weighted interpolation techniques

Analytical Chemistry

Volumn 80, Issue 13, 2008, Pages 4896-4905

  Milillo, Tammy M ^a   Gardella Jr , Joseph A ^a  

^a UNIVERSITY AT BUFFALO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EARTH SCIENCES; HIGH PERFORMANCE LIQUID CHROMATOGRAPHY; INTERPOLATION; INVERSE PROBLEMS; MASS SPECTROMETERS; MASS SPECTROMETRY; POSITION CONTROL; REMOTE SENSING; SECONDARY EMISSION; SECONDARY ION MASS SPECTROMETRY; SPACE OPTICS; SPECTROMETRY;

CHEMICAL IMAGING; INTERPOLATION METHODS; INTERPOLATION TECHNIQUES; INVERSE DISTANCE WEIGHTED (IDW); INVERSE DISTANCE WEIGHTED INTERPOLATION; ORDINARY KRIGING (OK); SECONDARY IONS; SPATIAL ANALYSES; SPATIAL DATA; TIME OF FLIGHT SECONDARY ION MASS SPECTROMETRY (TOF-SIMS); TIME-OF-FLIGHT (TOF);

IMAGE ENHANCEMENT;

FLUOROCARBON; POLYMER; SILOXANE;

ACCURACY; ANALYTIC METHOD; ANALYTICAL ERROR; ARTICLE; GEOGRAPHIC INFORMATION SYSTEM; IMAGE RECONSTRUCTION; TIME OF FLIGHT MASS SPECTROMETRY; VALIDATION PROCESS;

EID: 46849089260     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac702640v     Document Type: Article

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