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Volumn 33, Issue 15, 2000, Pages 5588-5592

Surface studies of the rearrangement of end groups of a polymer by ToF-SIMS and AFM

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS FILMS; ATOMIC FORCE MICROSCOPY; CONDENSATION REACTIONS; CRYSTALLINE MATERIALS; MORPHOLOGY; PHENOLS; PLASTIC FILMS; POLYMERIZATION; SECONDARY ION MASS SPECTROMETRY;

EID: 0034228109     PISSN: 00249297     EISSN: None     Source Type: Journal    
DOI: 10.1021/ma991142k     Document Type: Article
Times cited : (36)

References (26)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.