Prospects for imaging with TOF-SIMS using gold liquid metal ion sources

Applied Surface Science

Volumn 203-204, Issue , 2003, Pages 198-200

  Walker, Amy V ^a   Winograd, Nicholas ^a  

^a PENNSYLVANIA STATE UNIVERSITY   (United States)

Author keywords

Au ion sources; Imaging; SIMS; Sputtered ion yields

Indexed keywords

ALLOYS; DIMERS; EUTECTICS; GOLD; ION BEAMS; ION BOMBARDMENT; IONS; LIQUID METALS; SECONDARY ION MASS SPECTROMETRY;

SURFACE DAMAGE;

IMAGING TECHNIQUES;

EID: 0037438201     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(02)00624-4     Document Type: Conference Paper

References (9)

1. Kotter F., Benninghoven A. Appl. Surf. Sci. 113:1998;47.
2. Boussofiane-Baudin K., Bolbach G., Brunelle A., Della-Negra S., Hakansson P., LeBeyec Y. Nucl. Intsrum. Meth. B. 88:1994;160.
3. Harris R.D., Baker W.S., Van Stipdonk M.J., Crooks R.M., Schweikert E.A. Rapid Commun. Mass Spectrom. 13:1999;1374.
4. G. Gillen, L. King, B. Freibaum, R. Lareau, J. Bennett, Proceedings of SIMS XII (1999) 279.
5. S.R. Bryan, F. Reich, B.W. Schueler, G. Marsh, SIMS X (1995) 939.
6. B. Hagenhoff, R. Kersting, D. Rading, S. Kayser, E. Niehuis, SIMS XII (1999) 833.
7. N. Davies, J. Vickerman, P. Blenkinsopp, R. Hill, Private communication.
8. Brunelle A., Della-Negra S., Depauw J., Jacquet D., LeBeyec Y., Pautrat M., Baudin K., Anderson H.H. Phys. Rev. A. 63:2001;022902.
9. Schenkel T., Briere M.A., Schmidt-Bocking H., Bethge K., Schneider D.H. Phys. Rev. Lett. 78:1997;2481.