Optical characterization of InN layers grown by high-pressure chemical vapor deposition

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 26, Issue 4, 2008, Pages 1023-1026

  Alevli, M ^a   Atalay, R ^a   Durkaya, G ^a   Weesekara, A ^a   Perera, A G U ^a   Dietz, N ^a   Kirste, R ^b   Hoffmann, A ^b  

^a GEORGIA STATE UNIVERSITY   (United States)

^b TECHNISCHE UNIVERSITÄT BERLIN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

(PL) PROPERTIES; CHEMICAL VAPORS; FREE CARRIERS; FREE-CARRIER CONCENTRATION (FCC); GAN/SAPPHIRE; INFRARED (IR) REFLECTANCE; INFRARED REFLECTIONS; INN FILMS; INN LAYERS; OPTICAL (PET) (OPET); OPTICAL ABSORPTION EDGES; OPTICAL CHARACTERIZATIONS; OPTICAL TRANSMISSION SPECTRUM; TRANSMISSION SPECTROSCOPY;

ABSORPTION; BIOACTIVITY; CARRIER COMMUNICATION; CHEMICAL PROPERTIES; CHEMICAL VAPOR DEPOSITION; CIVIL AVIATION; ELECTROMAGNETIC WAVE ABSORPTION; ENERGY ABSORPTION; ESTIMATION; INFRARED SPECTROSCOPY; LIGHT ABSORPTION; METALLIZING; MOLECULAR BEAM EPITAXY; OPTICAL MATERIALS; OPTICAL PROPERTIES; PRESSURE; REFLECTION; SEMICONDUCTING CADMIUM TELLURIDE; STRUCTURAL PROPERTIES; VAPORS;

CARRIER CONCENTRATION;

EID: 46449125541     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.2908736     Document Type: Article

References (21)

1. A. G. Bhuiyan, A. Hashimoto, and A. Yamamoto, J. Appl. Phys. 94, 2779 (2003).
2. K. S. A. Butcher and T. L. Tansley, Superlattices Microstruct. 38, 1 (2005).
3. V. Y. Davydov and A. A. Klochikhin, Semiconductors 38, 861 (2004).
4. S. Nakamura, S. Masayuki, and T. Mukai, Jpn. J. Appl. Phys., Part 2 32, L8 (1993).
5. J. MacChesney, P. M. Bridenbaugh, and P. B. O'Connor, Mater. Res. Bull. 5, 783 (1970).
6. N. Dietz, in III-Nitrides Semiconductor Materials, edited by, Z. C. Feng, (Imperial College Press, 2006), pp. 203-255.
7. N. Dietz, M. Strassburg, and V. Woods, J. Vac. Sci. Technol. A 23, 1221 (2005).
8. V. Woods and N. Dietz, Mater. Sci. Eng., B 127, 239-250 (2006).
9. M. Alevli, G. Durkaya, W. Fenwick, A. Weerasekara, V. Woods, I. T. Ferguson, A. G. U. Perera, and N. Dietz, Appl. Phys. Lett. 89, 112119 (2006).
10. M. Alevli, Mater. Res. Soc. Symp. Proc. 955E, 1 (2007).
11. B. H. Cardelino, C. E. Moore, C. A. Cardelino, and N. Dietz, Proc. SPIE 5912, 86 (2005).
12. N. Dietz, V. Woods, S. McCall, and K. J. Bachmann, Proceedings of the Microgravity Conference, NASA/CP-2003-212339, 2003, pp. 169-181.
13. V. Y. Davydov, Appl. Phys. Lett. 75, 3297 (1999).
14. N. Dietz, M. Alevli, V. Woods, M. Strassburg, H. Kang, and I. T. Ferguson, Phys. Status Solidi B 242, 2985 (2006).
15. T. B. Wei, R. F. Duan, J. X. Wang, J. M. Li, Z. Q. Huo, P. Ma, Z. Liu, and Y. P. Zeng, J. Phys. D 40, 2881 (2007).
16. J. S. Thakur, D. Haddad, V. M. Naik, R. Naik, G. W. Auner, H. Lu, and W. J. Schaff, Phys. Rev. B 71, 115203 (2005).
17. F. Demangeot, C. Pinquier, J. Frandon, M. Gaio, O. Briot, B. Maleyre, S. Ruffenach, and B. Gil, Phys. Rev. B 71, 104305 (2005).
18. U. Fano, Phys. Rev. 124, 1866 (1961).
19. I. Wu Appl. Phys. Lett. 84, 2805 (2004).
20. T. Inushima, M. Higashiwaki, and T. Matsui, Phys. Rev. B 68, 235204 (2003).
21. T. Kawashima, H. Yoshikawa, S. Adachi, S. Fuke, and K. Ohtsuka, J. Appl. Phys. 82, 3528 (1997).