Field effect diode (FED): A novel device for ESD protection in deep sub-micron SOI technologies

Technical Digest - International Electron Devices Meeting, IEDM

Volumn , Issue , 2006, Pages

  Salman, Akram A ^a   Beebe, Stephen G ^a   Emam, Mostafa ^b   Pelella, Mario M ^a   Ioannou, Dimitris E ^b  

^a ADVANCED MICRO DEVICES   (United States)

^b George Mason University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEEP SUB-MICRON (DSM); DEVICE PARAMETERS; ELECTROSTATIC DISCHARGE (ESD) PROTECTION; FIELD EFFECT DIODE; HIGH-VOLTAGE (HV); INTERNATIONAL (CO); NEW APPROACHES; NOVEL DEVICES;

ELECTRON DEVICES; ELECTROSTATIC DEVICES; ELECTROSTATIC DISCHARGE; FIELD EMISSION DISPLAYS; PHOTOACOUSTIC EFFECT;

ELECTRIC BREAKDOWN;

EID: 46149123461     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IEDM.2006.346971     Document Type: Conference Paper

References (15)

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