Electrostatic discharge protection in silicon-on-insulator technology

IEEE International SOI Conference

Volumn , Issue , 1999, Pages 68-71

  Voldman, S ^a   Hui, D ^a   Warriner, L ^a   Young, D ^a   Williams, R ^a   Howard, J ^a   Gross, V ^a   Rausch, W ^a   Leobangdung, E ^a   Sherony, M ^a   Rohrer, N ^a   Akrout, C ^a   Assaderaghi, F ^a   Shahidi, G ^a  

^a IBM MICROELECTRONICS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC DISCHARGES; ELECTROSTATICS; MASKS; MICROPROCESSOR CHIPS; MOSFET DEVICES;

ELECTROSTATIC DISCHARGE (ESD) PROTECTION;

SILICON ON INSULATOR TECHNOLOGY;

EID: 0033314591     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)