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Volumn , Issue , 2006, Pages

XtreMOS™: The first integrated power transistor breaking the silicon limit

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON DEVICES; NONMETALS; POWER ELECTRONICS; POWER TRANSMISSION; SILICON; TRANSISTORS;

EID: 46049085836     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IEDM.2006.346933     Document Type: Conference Paper
Times cited : (42)

References (12)
  • 2
    • 0002106257 scopus 로고
    • HV thin layer devices (resurf devices)
    • J. Appels and H. Vaes, "HV thin layer devices (resurf devices)", IEDM Techn. Dig., 1979, pp238-241.
    • (1979) IEDM Techn. Dig , pp. 238-241
    • Appels, J.1    Vaes, H.2
  • 3
    • 0031251517 scopus 로고    scopus 로고
    • Theory of semiconductor superjunction devices
    • T. Fujihira, "Theory of semiconductor superjunction devices", Jpn. J. Appl. Phys, 36, pp6254-6262 (1997).
    • (1997) Jpn. J. Appl. Phys , vol.36 , pp. 6254-6262
    • Fujihira, T.1
  • 5
    • 27744578866 scopus 로고    scopus 로고
    • High performance super-junction UMOSFETs with split p-columns fabricated by multi-ion implantations
    • Y. Miura, H. Nimomiya and K. Kobayashi, "High performance super-junction UMOSFETs with split p-columns fabricated by multi-ion implantations",. Int. Symp. on Power Sem Dev, 2005, pp. 39-42.
    • (2005) Int. Symp. on Power Sem Dev , pp. 39-42
    • Miura, Y.1    Nimomiya, H.2    Kobayashi, K.3
  • 6
    • 34247548854 scopus 로고    scopus 로고
    • Breakthrough of on-resistance Si limit by super 3D MOSFET under 100V breakdown voltage
    • H. Yamagushi, Y. Urakami and J. Sakakibara, "Breakthrough of on-resistance Si limit by super 3D MOSFET under 100V breakdown voltage", Int. Symp. on Power Sem. Dev, 2006, pp. 61-64.
    • (2006) Int. Symp. on Power Sem. Dev , pp. 61-64
    • Yamagushi, H.1    Urakami, Y.2    Sakakibara, J.3
  • 7
    • 0035425002 scopus 로고    scopus 로고
    • Oxide bypassed VDMOS: And alternative to super-junction high voltage MOS power devices
    • Y.C. Liang, K.P. Gan and G.S. Samudra, "Oxide bypassed VDMOS: and alternative to super-junction high voltage MOS power devices", IEEE Electron Dev. Letters, 22, pp407-409 (2001).
    • (2001) IEEE Electron Dev. Letters , vol.22 , pp. 407-409
    • Liang, Y.C.1    Gan, K.P.2    Samudra, G.S.3
  • 8
    • 34247509800 scopus 로고    scopus 로고
    • Industrialization of resurf stepped oxide technology for power transistors
    • M. Gadja et al. "Industrialization of resurf stepped oxide technology for power transistors",. Int. Symp. on Power Sem Dev, 2006, pp. 109-112.
    • (2006) Int. Symp. on Power Sem Dev , pp. 109-112
    • Gadja, M.1
  • 9
    • 1642306307 scopus 로고    scopus 로고
    • On the specific on-resistance of high-voltage and power devices
    • R.P. Zingg, "On the specific on-resistance of high-voltage and power devices ", IEEE Trans. On Elec. Devices, 51, pp492-499 (2004).
    • (2004) IEEE Trans. On Elec. Devices , vol.51 , pp. 492-499
    • Zingg, R.P.1
  • 11
    • 10644244461 scopus 로고    scopus 로고
    • Novel fresurf LDMOSFET devices with improved BVDss-RDSon
    • V. Khemka et al., "Novel fresurf LDMOSFET devices with improved BVDss-RDSon", IEEE Electron Device Letters, 25, pp804-806 (2004).
    • (2004) IEEE Electron Device Letters , vol.25 , pp. 804-806
    • Khemka, V.1
  • 12
    • 0842331303 scopus 로고    scopus 로고
    • Vertical multi-resurf MOSFETS exhibiting record-low specific resistance
    • R. Van Daelen and C. Rochefort, "Vertical multi-resurf MOSFETS exhibiting record-low specific resistance", IEDM Techn. Dig., 2003, pp737-740.
    • (2003) IEDM Techn. Dig , pp. 737-740
    • Van Daelen, R.1    Rochefort, C.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.