Spectroscopic ellipsometry study of transparent conductive ZnO layers for CIGS solar cell applications

Thin Solid Films

Volumn 516, Issue 20, 2008, Pages 7016-7020

  Nemeth A ^a   Major, Cs ^a   Fried, M ^a   Labadi Z ^a   Barsony I ^a  

^a RESEARCH INSTITUTE FOR TECHNICAL PHYSICS AND MATERIALS SCIENCE   (Hungary)

Author keywords

Reactive sputtering; Spectroscopic ellipsometry; Transparent conductive oxides; Zinc oxide

Indexed keywords

ALLOYS; ALUMINUM; CESIUM; COPPER; DIRECT ENERGY CONVERSION; GALLIUM; GALLIUM ALLOYS; INDIUM ALLOYS; MAGNETRON SPUTTERING; PHOTOVOLTAIC CELLS; PLASMA DIAGNOSTICS; REACTIVE SPUTTERING; SELENIUM COMPOUNDS; SEMICONDUCTING ZINC COMPOUNDS; SOLAR CELLS; SOLAR EQUIPMENT; SPECTROSCOPIC ELLIPSOMETRY; SPUTTER DEPOSITION; THICK FILMS; THIN FILMS; ZINC; ZINC ALLOYS; ZINC OXIDE;

AL-DOPED ZNO (ZNO:AL); CIGS SOLAR CELLS; COPPER INDIUM GALLIUM DISELENIDE (CIGS); METALLIC ALLOYS; REACTIVE MAGNETRON SPUTTERING (RMS); TECHNOLOGICAL PARAMETERS; ZNO LAYERS;

SOLAR ENERGY;

EID: 45949110785     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2007.12.012     Document Type: Article

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