Nanoscale investigations of switching properties and piezoelectric activity in ferroelectric thin films using piezoresponse force microscopy

International Journal of Nanotechnology

Volumn 5, Issue 6-8, 2008, Pages 827-837

  Desfeux, R ^a   Ferri, A ^a   Legrand, C ^a   Maes L ^a   Da Costa, A ^a   Poullain, G ^b   Bouregba, R ^b   Soyer, C ^c   Remiens D ^c  

^a UNIVERSITÉ D'ARTOIS   (France)

^b LABORATOIRE CRISMAT   (France)

^c UNIVERSITÉ DE VALENCIENNES   (France)

Author keywords

Coercive voltage; Domain imaging; Local piezoelectric hysteresis loops; Nanoscale investigations; Pb(Zr, Ti)O3 ferroelectric films; Piezoelectric activity; Piezoresponse force microscopy; Switching properties

Indexed keywords

FERROELECTRIC FILMS; FERROELECTRIC THIN FILMS; FERROELECTRICITY; ION BEAMS; NANOTECHNOLOGY; PIEZOELECTRICITY; SCANNING PROBE MICROSCOPY; SWITCHING;

COERCIVE VOLTAGES; DOMAIN IMAGING; NANO SCALE; PB(ZR , TI)O3; PIEZOELECTRIC ACTIVITY; PIEZOELECTRIC HYSTERESIS LOOPS; PIEZORESPONSE FORCE MICROSCOPY; SWITCHING PROPERTIES;

THIN FILMS;

EID: 45849133758     PISSN: 14757435     EISSN: None     Source Type: Journal    
DOI: 10.1504/IJNT.2008.018701     Document Type: Article

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