Local characterization of compositionally graded Pb(Zr,Ti)O3 thin films by scanning force microscope

Materials Science and Engineering: B

Volumn 99, Issue 1-3, 2003, Pages 234-237

  Zeng, H R ^a   Li, G R ^a   Yin, Q R ^a   Xu, Z K ^b  

^a SHANGHAI INSTITUTE OF CERAMICS   (China)

^b CITY UNIVERSITY OF HONG KONG   (Hong Kong)

Author keywords

Graded ferroelectric thin film; Nanoscale domain; Scanning force microscope

Indexed keywords

CRYSTAL DEFECTS; CRYSTAL ORIENTATION; ELECTRIC SPACE CHARGE; FERROELECTRIC MATERIALS; FILM PREPARATION; MICROSCOPIC EXAMINATION; POLARIZATION; SOL-GELS; THIN FILMS;

SCANNING FORCE MICROSCOPY (SFM);

LEAD COMPOUNDS;

EID: 0037701516     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5107(02)00459-2     Document Type: Conference Paper

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