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Volumn 516, Issue 20, 2008, Pages 6954-6958

Impact of PECVD SiON stoichiometry and post-annealing on the silicon surface passivation

Author keywords

FTIR; SiON; Solar cells; Surface passivation; XPS

Indexed keywords

ANNEALING; ANTIREFLECTION COATINGS; CUBIC BORON NITRIDE; DIRECT ENERGY CONVERSION; NITRIDES; NONMETALS; PLASMA DEPOSITION; PLASMA DIAGNOSTICS; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; SILICON; SILICON NITRIDE; SOLAR ENERGY; STOICHIOMETRY; SURFACES; THIN FILMS;

EID: 45849099163     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2007.12.026     Document Type: Article
Times cited : (57)

References (23)
  • 4
    • 45849105113 scopus 로고    scopus 로고
    • J.F. Lelièvre, PhD Thesis, Institut des Nanotechnologies de Lyon, INSA de Lyon, France, 2007.
    • J.F. Lelièvre, PhD Thesis, Institut des Nanotechnologies de Lyon, INSA de Lyon, France, 2007.
  • 10
    • 45849084938 scopus 로고    scopus 로고
    • S. Naskar, PhD Thesis, Case Western Reserve University, Cleveland, United States, 2006.
    • S. Naskar, PhD Thesis, Case Western Reserve University, Cleveland, United States, 2006.
  • 19
    • 45849146461 scopus 로고    scopus 로고
    • R.C. Weast, M.J. Astle, Handbook of Chemistry and Physics, 62nd ed., CRC Press, Boca Raton, Florida, 1981-1982.
    • R.C. Weast, M.J. Astle, Handbook of Chemistry and Physics, 62nd ed., CRC Press, Boca Raton, Florida, 1981-1982.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.