Structural and optical properties of three-dimensional Si 1-xGex/Si nanostructures

Semiconductor Science and Technology

Volumn 23, Issue 6, 2008, Pages

  Lockwood, D J ^a   Baribeau, J M ^a   Kamenev, B V ^b   Lee, E K ^b   Tsybeskov, L ^b  

^a NATIONAL RESEARCH COUNCIL CANADA   (Canada)

^b NEW JERSEY INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

LIGHT EMISSION; LUMINESCENCE; MICROFLUIDICS; OPTICAL PROPERTIES; SEMICONDUCTING CADMIUM TELLURIDE; STRUCTURAL PROPERTIES; THREE DIMENSIONAL; X RAY ANALYSIS;

(PL) PROPERTIES; OPTICAL (PET) (OPET); RAMAN MEASUREMENTS; THREE DIMENSIONAL (3D); TIME-RESOLVED PHOTOLUMINESCENCE (TRPL);

SILICON;

EID: 45749145789     PISSN: 02681242     EISSN: 13616641     Source Type: Journal    
DOI: 10.1088/0268-1242/23/6/064003     Document Type: Article

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