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Volumn 79, Issue 20, 1997, Pages 3946-3949
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SiGe coherent islanding and stress relaxation in the high mobility regime
a a a b c |
Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0345473989
PISSN: 00319007
EISSN: 10797114
Source Type: Journal
DOI: 10.1103/PhysRevLett.79.3946 Document Type: Article |
Times cited : (158)
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References (18)
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