HgCdTe APD- Focal plane array development at CEA leti-minatec

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6940, Issue , 2008, Pages

  Rothman, Johan ^a   Perrais, Gwladys ^a   De Borniol, Eric ^a   Castelein, Pierre ^a   Baier, Nicolas ^a   Guellec, Fabrice ^a   Tchagaspanian, Michael ^a   Ballet, Philippe ^a   Mollard, Laurent ^a   Gout, Sylvain ^a   Perez, André ^a   Fournier, Maryse ^a   Chamonal, Jean Paul ^a   Tribolet, Philippe ^b   Destefanis, Gerard ^a  

^a CEA LETI   (France)

^b SOFRADIR   (France)

Author keywords

Active imaging; APD; EPL; Excess noise factor; FPA; Gain; HgCdTe; MBE; Response time

Indexed keywords

AVALANCHE DIODES; AVALANCHES (SNOWSLIDES); CHEMICAL MODIFICATION; COMPUTER NETWORKS; FOCUSING; INFRARED RADIATION; MERCURY COMPOUNDS; MULTITASKING; SNOW; SOFTWARE TESTING; SULFATE MINERALS; TECHNOLOGY; TESTING;

(P ,P ,T) MEASUREMENTS; ACTIVE IMAGING; AVALANCHE PHOTO DIODES (APD); DUAL MODES; FOCAL PLANE ARRAYS (FPAS); FOCAL PLANES; GAIN CHARACTERISTICS; HIGH DYNAMIC RANGE (HDR); INFRARED TECHNOLOGIES; LOW VOLTAGE TECHNOLOGY; PASSIVE IMAGING; PASSIVE MODE; RESPONSIVITY; TEST ARRAYS;

FOCAL PLANE ARRAYS;

EID: 45549090491     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.780447     Document Type: Conference Paper

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