Low frequency noise as a reliability diagnostic tool in compound semiconductor transistors

Microelectronics Reliability

Volumn 44, Issue 9-11 SPEC. ISS., 2004, Pages 1361-1368

  Labat, N ^a   Malbert, N ^a   Maneux, C ^a   Touboul, A ^a  

^a CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ACOUSTIC NOISE MEASUREMENT; ELECTRIC CURRENTS; INTERFACES (MATERIALS); MICROWAVE DEVICES; PASSIVATION; RELIABILITY; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTING INDIUM PHOSPHIDE;

COMPOUND SEMICONDUCTOR TRANSISTORS; LOW FREQUENCY NOISE;

FIELD EFFECT TRANSISTORS;

EID: 4544358392     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.microrel.2004.07.035     Document Type: Conference Paper

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