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Volumn , Issue , 2002, Pages 189-196
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Logic characterization vehicle to determine process variation impact on yield and performance of digital circuits
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Author keywords
[No Author keywords available]
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Indexed keywords
DESIGN FOR TESTABILITY;
INTERFACES (COMPUTER);
LOGIC CIRCUITS;
MICROELECTRONIC PROCESSING;
SEMICONDUCTOR DEVICE MANUFACTURE;
SENSITIVITY ANALYSIS;
CHIPS FUNCTIONALITY;
DESIGN OF EXPERIMENTS;
LOGIC CHARACTERIZATION VEHICLE;
DIGITAL CIRCUITS;
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EID: 0037481688
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (22)
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References (6)
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