Noise-aware driver modeling for nanometer technology

Proceedings - International Symposium on Quality Electronic Design, ISQED

Volumn 2003-January, Issue , 2003, Pages 177-182

  Bai, Xiaoliang ^a   Chandra, Rajit ^b   Dey, Sujit ^a   Srinivas, P V ^c  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b Gradient Design Systems   (United States)

^c MAGMA DESIGN AUTOMATION   (United States)

Author keywords

Analytical models; Circuit analysis; Circuit noise; Circuit simulation; Crosstalk; Driver circuits; Electronics industry; Semiconductor device noise; System on a chip; Wires

Indexed keywords

ANALYTICAL MODELS; APPLICATION SPECIFIC INTEGRATED CIRCUITS; CIRCUIT SIMULATION; CROSSTALK; ELECTRONICS INDUSTRY; MICROPROCESSOR CHIPS; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR DEVICE MODELS; SEMICONDUCTOR DEVICES; SYSTEM-ON-CHIP; WIRE;

CIRCUIT NOISE; CIRCUIT-LEVEL SIMULATION; COMPUTATION OVERHEADS; DRIVER CIRCUIT; LINEAR CIRCUIT MODELS; SEMICONDUCTOR DEVICE NOISE; SEMICONDUCTOR INDUSTRY; SYSTEM ON A CHIP;

ELECTRIC NETWORK ANALYSIS;

EID: 67649647250     PISSN: 19483287     EISSN: 19483295     Source Type: Conference Proceeding    
DOI: 10.1109/ISQED.2003.1194728     Document Type: Conference Paper

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