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Volumn 74, Issue 905, 2002, Pages 30-31+33
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Identifying IR drop in high performance nanometer design
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NONE
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRIC POWER SUPPLIES TO APPARATUS;
FLIP CHIP DEVICES;
INTEGRATED CIRCUIT LAYOUT;
INTEGRATED CIRCUIT MANUFACTURE;
INTEGRATED CIRCUIT TESTING;
TRANSISTORS;
ELECTRONIC DESIGN AUTOMATION;
FLIP-CHIP METHODS;
NANOMETER DESIGN;
VOLTAGE DROP;
ELECTRIC NETWORK ANALYSIS;
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EID: 0036610776
PISSN: 00134902
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
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Times cited : (2)
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References (0)
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