Multiple-Parameter CMOS IC Testing with Increased Sensitivity for I DDQ

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Volumn 11, Issue 5, 2003, Pages 863-870

  Keshavarzi, Ali ^a   Roy, Kaushik ^b   Hawkins, Charles F ^c   De, Vivek ^a  

^a INTEL CORPORATION   (United States)

^b PURDUE UNIVERSITY   (United States)

^c UNIVERSITY OF NEW MEXICO   (United States)

Author keywords

Current testing; Leakage curent; Multiparameter testing; Reverse body bias (RBB)

Indexed keywords

CMOS INTEGRATED CIRCUITS; COOLING; LEAKAGE CURRENTS; PARAMETER ESTIMATION; SENSITIVITY ANALYSIS;

REVERSE BODY BIAS (RBB);

INTEGRATED CIRCUIT TESTING;

EID: 0142258186     PISSN: 10638210     EISSN: None     Source Type: Journal    
DOI: 10.1109/TVLSI.2003.812298     Document Type: Article

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