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Volumn 39, Issue 18, 2004, Pages 5817-5823

Calculation of residual thermal stress in GaN epitaxial layers grown on technologically important substrates

Author keywords

[No Author keywords available]

Indexed keywords

BUFFER LAYERS; COEFFICIENT OF THERMAL EXPANSION (CTE); EPITAXIAL LAYERS; UNDERWATER COMMUNICATIONS;

EID: 4444274331     PISSN: 00222461     EISSN: None     Source Type: Journal    
DOI: 10.1023/B:JMSC.0000040094.33095.6f     Document Type: Article
Times cited : (41)

References (48)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.