SCOPUS 정보 검색 플랫폼

Volumn 108, Issue 7, 2008, Pages 671-676

Near-field scanning optical microscope probe analysis

Author keywords

Artifacts; NSOM

Indexed keywords

ELECTROMAGNETIC FIELD EFFECTS; MATHEMATICAL MODELS; MEASUREMENT THEORY; RADIATION EFFECTS; SCANNING ELECTRON MICROSCOPY;

ELECTROMAGNETIC FIELD MODELING; FAR-FIELD RADIATION DIAGRAMS;

OPTICAL MICROSCOPY;

ARTICLE; ELECTROMAGNETIC FIELD; INTERMETHOD COMPARISON; MOLECULAR PROBE; SCANNING ELECTRON MICROSCOPY; SCANNING NEAR FIELD OPTICAL MICROSCOPY;

EID: 44149107789 PISSN: 03043991 EISSN: None Source Type: Journal
DOI: 10.1016/j.ultramic.2007.10.014 Document Type: Article

Times cited : (3)

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