The role of propagating and evanescent waves in scanning near-field optical microscopy

Optics Communications

Volumn 260, Issue 2, 2006, Pages 727-732

  Alvarez, Lydia ^a   Xiao, Mufei ^b,c  

^a UNIVERSIDAD AUTÓNOMA DE BAJA CALIFORNIA   (Mexico)

^b CENTRO DE CIENCIAS DE LA MATERIA CONDENSADA   (Mexico)

^c UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION; FIBERS; IMAGE PROCESSING; METHOD OF MOMENTS; MICROSCOPES; SCANNING; WAVES;

DIFFRACTION LIMIT; EVANESCENT WAVES; PROPAGATING; PROPAGATING WAVES; SUB-WAVELENGTH APERTURE;

NEAR FIELD SCANNING OPTICAL MICROSCOPY;

EID: 33644944526     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optcom.2005.10.063     Document Type: Article

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