Topographic cross talk in reflection mode near-field optical microscopy on patterned structures

Journal of Applied Physics

Volumn 89, Issue 12, 2001, Pages 7727-7729

  Rosenberger, A ^a   Munnemann A ^a   Kiendl, F ^a   Guntherodt G ^a   Rosenbusch, P ^b   Bland, J A C ^b   Eggers, G ^c   Fumagalli, P ^c  

^a RWTH AACHEN UNIVERSITY   (Germany)

^b UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^c FREIE UNIVERSITÄT BERLIN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035875613     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1364642     Document Type: Article

References (11)

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