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Volumn 256, Issue 4-6, 2005, Pages 476-488

Scanning near-field optical microscopy of metallic features

Author keywords

Computer simulation; Contrast mechanisms; Finite difference time domain; Near field optical microscopy; SNOM

Indexed keywords

COMPUTER SIMULATION; FINITE DIFFERENCE METHOD; IMAGE PROCESSING; METAL ANALYSIS; NUMERICAL ANALYSIS; SILICA;

EID: 27744463822     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optcom.2005.06.073     Document Type: Article
Times cited : (10)

References (35)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.