SCOPUS 정보 검색 플랫폼

Volumn 147, Issue 1-3, 2004, Pages 171-173

Modelling topographical artifacts in scanning near-field optical microscopy

Author keywords

Artifacts; Probe radius; Simulation; SNOM

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPUTER SIMULATION; IMAGING TECHNIQUES; LIGHT EMITTING DIODES; PROBES; SCANNING TUNNELING MICROSCOPY; TOPOLOGY;

ARTIFACTS; OPTICAL CONTRAST; PHASE-SEGREGATION PHENOMENON; PROBE RADIUS;

NEAR FIELD SCANNING OPTICAL MICROSCOPY;

EID: 9944222431 PISSN: 03796779 EISSN: None Source Type: Journal
DOI: 10.1016/j.synthmet.2004.06.030 Document Type: Conference Paper

Times cited : (16)

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