Sensitivity of multigate MOSFETs to process variations - An assessment based on analytical solutions of 3-D Poisson's equation

IEEE Transactions on Nanotechnology

Volumn 7, Issue 3, 2008, Pages 299-304

  Wu, Yu Sheng ^b   Su, Pin ^a,b  

^a IEEE

^b NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

Author keywords

3 D Poisson's equation; FinFET; Multigate MOS FETs; Tri gate; Variation

Indexed keywords

COMPUTER SIMULATION; NUMERICAL METHODS; POISSON EQUATION; PROBLEM SOLVING;

3-D POISSON'S EQUATION; MULTIGATE MOS-FET;

MOSFET DEVICES;

EID: 44049087277     PISSN: 1536125X     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNANO.2008.917835     Document Type: Article

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