-
1
-
-
0031191310
-
Elementary scattering theory of the Si MOSFET
-
Jul
-
M. S. Lundstrom, "Elementary scattering theory of the Si MOSFET," IEEE Electron Device Lett., vol. 18, no. 7, pp. 361-363, Jul. 1997.
-
(1997)
IEEE Electron Device Lett
, vol.18
, Issue.7
, pp. 361-363
-
-
Lundstrom, M.S.1
-
2
-
-
0036253371
-
Essential physics of carrier transport in nanoscale MOSFETs
-
Jan
-
M. Lundstrom and Z. Ren, "Essential physics of carrier transport in nanoscale MOSFETs," IEEE Trans. Electron Devices, vol. 49, no. 1, pp. 133-141, Jan. 2002.
-
(2002)
IEEE Trans. Electron Devices
, vol.49
, Issue.1
, pp. 133-141
-
-
Lundstrom, M.1
Ren, Z.2
-
3
-
-
0036494049
-
A compact scattering model for the nanoscale double-gate MOSFET
-
Mar
-
A. Rahman and M. S. Lundstrom, "A compact scattering model for the nanoscale double-gate MOSFET," IEEE Trans. Electron Devices, vol. 49, no. 3, pp. 481-489, Mar. 2002.
-
(2002)
IEEE Trans. Electron Devices
, vol.49
, Issue.3
, pp. 481-489
-
-
Rahman, A.1
Lundstrom, M.S.2
-
4
-
-
43749096908
-
Decoupling channel backscattering coefficients in nanoscale MOSFETs to establish near-source channel conduction-band profiles
-
Jun
-
M. J. Chen, R. T. Chen, and Y. S. Lin, "Decoupling channel backscattering coefficients in nanoscale MOSFETs to establish near-source channel conduction-band profiles," in Proc. Silicon Nanoelectronics Workshop, Jun. 2005, pp. 50-51.
-
(2005)
Proc. Silicon Nanoelectronics Workshop
, pp. 50-51
-
-
Chen, M.J.1
Chen, R.T.2
Lin, Y.S.3
-
5
-
-
33847372859
-
Temperature-oriented experiment and simulation as corroborating evidence of MOSFET backscattering theory
-
Feb
-
M. J. Chen, S. G. Yan, R. T. Chen, C. Y. Hsieh, P. W. Huang, and H. P. Chen, "Temperature-oriented experiment and simulation as corroborating evidence of MOSFET backscattering theory," IEEE Electron Device Lett., vol. 28, no. 2, pp. 177-179, Feb. 2007.
-
(2007)
IEEE Electron Device Lett
, vol.28
, Issue.2
, pp. 177-179
-
-
Chen, M.J.1
Yan, S.G.2
Chen, R.T.3
Hsieh, C.Y.4
Huang, P.W.5
Chen, H.P.6
-
6
-
-
4444272856
-
Separation of channel backscattering coefficients in nanoscale MOSFETs
-
Sep
-
M. J. Chen, H. T. Huang, Y. C. Chou, R. T. Chen, Y. T. Tseng, P. N. Chen, and C. H. Diaz, "Separation of channel backscattering coefficients in nanoscale MOSFETs," IEEE Trans. Electron Devices, vol. 51, no. 9, pp. 1409-1415, Sep. 2004.
-
(2004)
IEEE Trans. Electron Devices
, vol.51
, Issue.9
, pp. 1409-1415
-
-
Chen, M.J.1
Huang, H.T.2
Chou, Y.C.3
Chen, R.T.4
Tseng, Y.T.5
Chen, P.N.6
Diaz, C.H.7
-
7
-
-
0036930453
-
Temperature dependent channel backscattering coefficients in nanoscale MOSFETs
-
Dec
-
M. J. Chen, H. T. Huang, K. C. Huang, P. N. Chen, C. S. Chang, and C. H. Diaz, "Temperature dependent channel backscattering coefficients in nanoscale MOSFETs," in IEDM Tech. Dig., Dec. 2002 pp. 39-42.
-
(2002)
IEDM Tech. Dig
, pp. 39-42
-
-
Chen, M.J.1
Huang, H.T.2
Huang, K.C.3
Chen, P.N.4
Chang, C.S.5
Diaz, C.H.6
-
8
-
-
29244435059
-
Understanding quasi-ballistic transport in nano-MOSFETs: Part I - Scattering in the channel and in the drain
-
Dec
-
P. Palestri, D. Esseni, S. Eminente, C. Fiegna, E. Sangiorgi, and L. Selmi, "Understanding quasi-ballistic transport in nano-MOSFETs: Part I - Scattering in the channel and in the drain," IEEE Trans. Electron Devices, vol. 52, no. 12, pp. 2727-2735, Dec. 2005.
-
(2005)
IEEE Trans. Electron Devices
, vol.52
, Issue.12
, pp. 2727-2735
-
-
Palestri, P.1
Esseni, D.2
Eminente, S.3
Fiegna, C.4
Sangiorgi, E.5
Selmi, L.6
-
9
-
-
33846963511
-
A new backscattering model giving a description of the quasi-ballistic transport in nano-MOSFET
-
Oct
-
E. Fuchs, P. Dollfus, G. L. Carval, S. Barraud, D. Villanueva, F. Salvetti, H. Jaouen, and T. Skotnicki, "A new backscattering model giving a description of the quasi-ballistic transport in nano-MOSFET," IEEE Trans. Electron Devices, vol. 52, no. 10, pp. 2280-2289, Oct. 2005.
-
(2005)
IEEE Trans. Electron Devices
, vol.52
, Issue.10
, pp. 2280-2289
-
-
Fuchs, E.1
Dollfus, P.2
Carval, G.L.3
Barraud, S.4
Villanueva, D.5
Salvetti, F.6
Jaouen, H.7
Skotnicki, T.8
-
10
-
-
29244485621
-
Understanding quasi-ballistic transport in nano-MOSFETs: Part II - Technology scaling along the ITRS
-
Dec
-
S. Eminente, D. Esseni, P. Palestri, C. Fiegna, L. Selmi, and E. Sangiorgi, "Understanding quasi-ballistic transport in nano-MOSFETs: Part II - Technology scaling along the ITRS," IEEE Trans. Electron Devices, vol. 52, no. 12, pp. 2736-2743, Dec. 2005.
-
(2005)
IEEE Trans. Electron Devices
, vol.52
, Issue.12
, pp. 2736-2743
-
-
Eminente, S.1
Esseni, D.2
Palestri, P.3
Fiegna, C.4
Selmi, L.5
Sangiorgi, E.6
-
11
-
-
4344599060
-
On the ballistic transport in nanometer-scaled DG MOSFETs
-
Jul
-
J. Saint-Martin, A. Bournel, and P. Dollfus, "On the ballistic transport in nanometer-scaled DG MOSFETs," IEEE Trans. Electron Devices, vol. 51, no. 7, pp. 1148-1155, Jul. 2004.
-
(2004)
IEEE Trans. Electron Devices
, vol.51
, Issue.7
, pp. 1148-1155
-
-
Saint-Martin, J.1
Bournel, A.2
Dollfus, P.3
-
12
-
-
41749120574
-
On the ability of the particle Monte Carlo technique to include quantum effects in nano-MOSFET simulation
-
Sep
-
D. Querlioz, J. Saint-Martin, K. Huet, A. Bournel, V. Aubry-Fortuna, C. Chassat, S. Galdin-Retailleau, and P. Dollfus, "On the ability of the particle Monte Carlo technique to include quantum effects in nano-MOSFET simulation," IEEE Trans. Electron Devices, vol. 54, no. 9, pp. 2232-2242, Sep. 2007.
-
(2007)
IEEE Trans. Electron Devices
, vol.54
, Issue.9
, pp. 2232-2242
-
-
Querlioz, D.1
Saint-Martin, J.2
Huet, K.3
Bournel, A.4
Aubry-Fortuna, V.5
Chassat, C.6
Galdin-Retailleau, S.7
Dollfus, P.8
-
13
-
-
0034317189
-
+ poly-gate pMOSFETs with ultrathin gate oxides
-
Nov
-
+ poly-gate pMOSFETs with ultrathin gate oxides," IEEE Trans. Electron Devices, vol. 47, no. 11, pp. 2161-2166, Nov. 2000.
-
(2000)
IEEE Trans. Electron Devices
, vol.47
, Issue.11
, pp. 2161-2166
-
-
Yang, K.N.1
Huang, H.T.2
Chang, M.C.3
Chu, C.M.4
Chen, Y.S.5
Chen, M.J.6
Lin, Y.M.7
Yu, M.C.8
Jang, S.M.9
Yu, C.H.10
Liang, M.S.11
|