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Volumn 55, Issue 5, 2008, Pages 1265-1268

A parabolic potential barrier-oriented compact model for the kBT layer's width in nano-MOSFETs

Author keywords

Backscattering; MOSFET; Nanometer

Indexed keywords

COMPUTATIONAL GEOMETRY; COMPUTER SIMULATION; ELECTRIC POTENTIAL; GATES (TRANSISTOR); MATHEMATICAL MODELS; THERMAL ENERGY;

EID: 43749100946     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2008.919317     Document Type: Article
Times cited : (13)

References (13)
  • 1
    • 0031191310 scopus 로고    scopus 로고
    • Elementary scattering theory of the Si MOSFET
    • Jul
    • M. S. Lundstrom, "Elementary scattering theory of the Si MOSFET," IEEE Electron Device Lett., vol. 18, no. 7, pp. 361-363, Jul. 1997.
    • (1997) IEEE Electron Device Lett , vol.18 , Issue.7 , pp. 361-363
    • Lundstrom, M.S.1
  • 2
    • 0036253371 scopus 로고    scopus 로고
    • Essential physics of carrier transport in nanoscale MOSFETs
    • Jan
    • M. Lundstrom and Z. Ren, "Essential physics of carrier transport in nanoscale MOSFETs," IEEE Trans. Electron Devices, vol. 49, no. 1, pp. 133-141, Jan. 2002.
    • (2002) IEEE Trans. Electron Devices , vol.49 , Issue.1 , pp. 133-141
    • Lundstrom, M.1    Ren, Z.2
  • 3
    • 0036494049 scopus 로고    scopus 로고
    • A compact scattering model for the nanoscale double-gate MOSFET
    • Mar
    • A. Rahman and M. S. Lundstrom, "A compact scattering model for the nanoscale double-gate MOSFET," IEEE Trans. Electron Devices, vol. 49, no. 3, pp. 481-489, Mar. 2002.
    • (2002) IEEE Trans. Electron Devices , vol.49 , Issue.3 , pp. 481-489
    • Rahman, A.1    Lundstrom, M.S.2
  • 4
    • 43749096908 scopus 로고    scopus 로고
    • Decoupling channel backscattering coefficients in nanoscale MOSFETs to establish near-source channel conduction-band profiles
    • Jun
    • M. J. Chen, R. T. Chen, and Y. S. Lin, "Decoupling channel backscattering coefficients in nanoscale MOSFETs to establish near-source channel conduction-band profiles," in Proc. Silicon Nanoelectronics Workshop, Jun. 2005, pp. 50-51.
    • (2005) Proc. Silicon Nanoelectronics Workshop , pp. 50-51
    • Chen, M.J.1    Chen, R.T.2    Lin, Y.S.3
  • 5
    • 33847372859 scopus 로고    scopus 로고
    • Temperature-oriented experiment and simulation as corroborating evidence of MOSFET backscattering theory
    • Feb
    • M. J. Chen, S. G. Yan, R. T. Chen, C. Y. Hsieh, P. W. Huang, and H. P. Chen, "Temperature-oriented experiment and simulation as corroborating evidence of MOSFET backscattering theory," IEEE Electron Device Lett., vol. 28, no. 2, pp. 177-179, Feb. 2007.
    • (2007) IEEE Electron Device Lett , vol.28 , Issue.2 , pp. 177-179
    • Chen, M.J.1    Yan, S.G.2    Chen, R.T.3    Hsieh, C.Y.4    Huang, P.W.5    Chen, H.P.6
  • 7
    • 0036930453 scopus 로고    scopus 로고
    • Temperature dependent channel backscattering coefficients in nanoscale MOSFETs
    • Dec
    • M. J. Chen, H. T. Huang, K. C. Huang, P. N. Chen, C. S. Chang, and C. H. Diaz, "Temperature dependent channel backscattering coefficients in nanoscale MOSFETs," in IEDM Tech. Dig., Dec. 2002 pp. 39-42.
    • (2002) IEDM Tech. Dig , pp. 39-42
    • Chen, M.J.1    Huang, H.T.2    Huang, K.C.3    Chen, P.N.4    Chang, C.S.5    Diaz, C.H.6
  • 8
    • 29244435059 scopus 로고    scopus 로고
    • Understanding quasi-ballistic transport in nano-MOSFETs: Part I - Scattering in the channel and in the drain
    • Dec
    • P. Palestri, D. Esseni, S. Eminente, C. Fiegna, E. Sangiorgi, and L. Selmi, "Understanding quasi-ballistic transport in nano-MOSFETs: Part I - Scattering in the channel and in the drain," IEEE Trans. Electron Devices, vol. 52, no. 12, pp. 2727-2735, Dec. 2005.
    • (2005) IEEE Trans. Electron Devices , vol.52 , Issue.12 , pp. 2727-2735
    • Palestri, P.1    Esseni, D.2    Eminente, S.3    Fiegna, C.4    Sangiorgi, E.5    Selmi, L.6
  • 10
    • 29244485621 scopus 로고    scopus 로고
    • Understanding quasi-ballistic transport in nano-MOSFETs: Part II - Technology scaling along the ITRS
    • Dec
    • S. Eminente, D. Esseni, P. Palestri, C. Fiegna, L. Selmi, and E. Sangiorgi, "Understanding quasi-ballistic transport in nano-MOSFETs: Part II - Technology scaling along the ITRS," IEEE Trans. Electron Devices, vol. 52, no. 12, pp. 2736-2743, Dec. 2005.
    • (2005) IEEE Trans. Electron Devices , vol.52 , Issue.12 , pp. 2736-2743
    • Eminente, S.1    Esseni, D.2    Palestri, P.3    Fiegna, C.4    Selmi, L.5    Sangiorgi, E.6
  • 11
    • 4344599060 scopus 로고    scopus 로고
    • On the ballistic transport in nanometer-scaled DG MOSFETs
    • Jul
    • J. Saint-Martin, A. Bournel, and P. Dollfus, "On the ballistic transport in nanometer-scaled DG MOSFETs," IEEE Trans. Electron Devices, vol. 51, no. 7, pp. 1148-1155, Jul. 2004.
    • (2004) IEEE Trans. Electron Devices , vol.51 , Issue.7 , pp. 1148-1155
    • Saint-Martin, J.1    Bournel, A.2    Dollfus, P.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.