Temperature dependent channel backscattering coefficients in nanoscale MOSFETs

Technical Digest - International Electron Devices Meeting

Volumn , Issue , 2002, Pages 39-42

  Chen, Ming Jer ^a   Huang, Huan Tsung ^b   Huang, Kuo Chuan ^a   Chen, Po Nien ^a   Chang, Chih Sheng ^b   Diaz, Carlos H ^b  

^a NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

^b TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC POTENTIAL; ELECTROMAGNETIC WAVE BACKSCATTERING; GATES (TRANSISTOR); MASKS; MATHEMATICAL MODELS; NANOTECHNOLOGY;

DRAIN CURRENT;

MOSFET DEVICES;

EID: 0036930453     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)

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8. S. Datta, F. Assad, and M. S. Lundstrom, Superlattices and Microstructures, p. 771, 1998.