Depth distribution of irradiation-induced cross-linking in aromatic self-assembled monolayers

Langmuir

Volumn 20, Issue 17, 2004, Pages 7166-7170

  Tai, Y ^a   Shaporenko, A ^a   Eck, W ^a   Grunze, M ^a   Zharnikov, M ^a  

^a UNIVERSITY OF HEIDELBERG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CROSSLINKING; DEHYDROGENATION; ELECTRON IRRADIATION; IONIZING RADIATION; LITHOGRAPHY; RELAXATION PROCESSES; SELF ASSEMBLY;

ELECTRONIC EXCITATIONS; MOLECULAR ORBITALS; PHOTON ENERGIES (PE); SELF-ASSEMBLY MONOLAYERS (SAM);

MONOLAYERS;

CROSS LINKING; DEHYDROGENATION; IONIZING RADIATION; LITHOGRAPHY; MONOLAYERS; RADIATION EFFECTS; RELAXATION;

(1,1' 4',1'' TERPHENYL) 4,4'' DIMETHANETHIOL; (1,1'-4',1''-TERPHENYL)-4,4''-DIMETHANETHIOL; AROMATIC HYDROCARBON; CROSS LINKING REAGENT; GOLD; TERPHENYL DERIVATIVE; THIOL DERIVATIVE;

ARTICLE; ARTIFICIAL MEMBRANE; CHEMICAL STRUCTURE; CHEMISTRY; ELECTRON; RADIATION EXPOSURE; SENSITIVITY AND SPECIFICITY; SPECTROSCOPY; SURFACE PROPERTY; X RAY;

CROSS-LINKING REAGENTS; ELECTRONS; GOLD; HYDROCARBONS, AROMATIC; MEMBRANES, ARTIFICIAL; MOLECULAR STRUCTURE; SENSITIVITY AND SPECIFICITY; SPECTRUM ANALYSIS; SULFHYDRYL COMPOUNDS; SURFACE PROPERTIES; TERPHENYL COMPOUNDS; X-RAYS;

EID: 4344645861     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la040047o     Document Type: Article

References (44)

1. Ulman, A. An Introduction to Ultrathin Organic Films: Langmuir-Blodgett to Self-Assembly; Academic Press: New York, 1991.
2. Ulman, A. Chem. Rev. 1996, 96, 1533.
3. Thin films: self-assembled monolayers of thiols; Ulman A., Ed.; Academic Press: San Diego, CA, 1998.
4. Schreiber, F. Prog. Surf. Sci. 2000, 65, 151.
5. Sabatani, E.; Cohen-Boulakia, J.; Bruening, M.; Rubinstein, I. Langmuir 1993, 9, 2974.
6. Tour, J. M.; Jones, L., II; Pearson, D. L.; Lamba, J. S.; Burgin, T. P.; Whitesides, G. M.; Allara, D. L.; Parikh, A. N.; Atre, S. V. J. Am. Chem. Soc. 1995, 117, 9529.
7. Dhirani, A.-A.; Zehner, W.; Hsung, R.P.; Guyot-Sionnest, P.; Sita, L. J. Am. Chem. Soc. 1996, 118, 3319.
8. Tao, Y.-T.; Wu, C.-C.; Eu, J.-Y.; Lin, W.-L. Langmuir 1997, 13, 4018.
9. Kang, J. F.; Liao, S.; Jordan, R.; Ulman, A. J. Am. Chem. Soc. 1998, 120, 9662.
10. Himmel, H.-J.; Terfort, A.; Wöll, Ch. J. Am. Chem. Soc. 1998, 120, 12069.
11. Ishida, T.; Choi, N.; Mizutani, W.; Tokumoto, H.; Kojima, I.; Azehara, H.; Hokari, H.; Akiba, U.; Fujihira, M. Langmuir 1999, 15, 6799.
12. Leung, T. Y. B.; Schwartz, P.; Scoles, G.; Schreiber, F.; Ulman, A. Surf. Sci. 2000, 458, 34.
13. Frey, S.; Stadler, V.; Heister, K.; Zharnikov, M.; Grunze, M.; Zeysing, B.; Terfort, A. Langmuir 2001, 17, 2408.
14. Ishida, T.; Mizutani, W.; Azehara, H.; Sato, F.; Choi, N.; Akiba, U.; Fujihira, M.; Tokumoto, H. Langmuir 2001, 17, 7459.
15. Kang, J. F.; Ulman, A.; Liao, S.; Jordan, R.; Yang, G.; Liu, G.-y. Langmuir 2001, 17, 95.
16. Fuxen, C.; Azzam, W.; Arnold, R.; Witte, G.; Terfort, A.; Wöll, Ch. Langmuir 2001, 17, 3689.
17. Zharnikov, M.; Küller, A.; Shaporenko, A.; Schmidt, E.; Eck, W. Langmuir 2003, 19, 4682.
18. Shaporenko, A.; Adlkofer, K.; Johansson, L. S. O.; Tanaka, M.; Zharnikov, M. Langmuir 2003, 19, 4992.
19. Bumm, L. A.; Arnold, J. J.; Cygan, M. T.; Dunbar, T. D.; Burgin, T. P.; Jones, L., II; Allara, D. L.; Tour, J. M.; Weiss, P. S. Science 1996, 271, 1705.
20. Adams, D. M.; et al. J. Phys. Chem. B 2003, 107, 7716.
21. Brandow, S. L.; Chen, M.-S.; Aggarwal, R.; Dulcey, C. S.; Calvert, J. M.; Dressick, W. J. Langmuir 1999, 15, 5429.
22. Geyer, W.; Stadler, V.; Eck, W.; Zharnikov, M.; Gölzhëuser, A.; Grunze, M. Appl. Phys. Lett. 1999, 75, 2401.
23. Dressick, W. J.; Chen, M.-S.; Brandow, S. L. J. Am. Chem. Soc. 2000, 122, 98.
24. Eck, W.; Stadler, V.; Geyer, W.; Zharnikov, M.; Gölzhäuser, A.; Grunze, M. Adv. Mater. 2000, 12, 805.
25. Gölzhäuser, A.; Eck, W.; Geyer, W.; Stadler, V.; Weimann, T.; Hinze, P.; Grunze, M. Adv. Mater. 2001, 13, 806.
26. Frey, S.; Rong, H.-T.; Heister, K.; Yang, Y.-J.; Buck, M.; Zharnikov, M. Langmuir 2002, 18, 3142.
27. Zharnikov, M.; Grunze, M. J. Vac. Sci. Technol., B 2002, 20, 1793.
28. Tai, Y.; Shaporenko, A.; Rong, H.-T.; Buck, M.; Eck, W.; Grunze, M.; Zharnikov, M. J. Phys. Chem. B, submitted for publication.
29. Azzam, W.; Wehner, B. I.; Fisher, R. A.; Terfort, A.; Wöll, Ch. Langmuir 2002, 18, 7766.
30. Zharnikov, M.; Frey, S.; Rong, H.; Yang, Y. J.; Heister, K.; Buck, M.; Grunze, M. Phys. Chem. Chem. Phys. 2000, 2, 3359.
31. Hong, H. T.; Frey, S.; Yang, Y. J.; Zharnikov, M.; Buck, M.; Wühn, M.; Wöll, Ch.; Helmchen, G. Langmuir 2001, 17, 1582.
32. Azzam, W.; Cyganik, P.; Witte, G.; Buck, M.; Wöll, Ch. Langmuir 2003, 19, 8262.
33. Shaporenko, A.; Brunnbauer, M.; Terfort, A.; Grunze, M.; Zharnikov M. J. Phys. Chem. B, in print.
34. Ishicla, T.; Mizutani, W.; Akiba, U.; Umemura, K.; Inoue, A.; Choi, N.; Fujihira, M.; Tokumoto, H. J. Phys. Chem. B 1999, 103, 1686.
35. Stöhr, J. NEXAFS Spectroscopy; Springer Series in Surface Science 25; Springer-Verlag: Berlin, 1992.
36. Köhn, F. Diploma Thesis, Universität Heidelberg, Heidelberg, Germany, 1998.
37. Heister, K.; Zharnikov, M.; Grunze, M.; Johanason, L. S. O. J. Phys. Chem. B 2001, 105, 4058.
38. Laibinis, P. E.; Graham, R. L.; Biebuyck, H. A.; Whitesides, G. M. Science 1991, 254, 981.
39. Graham, R. L.; Bain, C. D.; Biebuyck, H. A.; Laibinis, P. E.; Whitesides, G. M. J. Phys. Chem. 1998, 97, 9456.
40. Wirde, M.; Gelius, U.; Dunbar, T.; Allara, D. L. Nucl. Instrum. Methods Phys. Res., Sect. B 1997, 131, 245.
41. Batson, P. E. Phys. Rev. B 1993, 48, 2608.
42. Zharnikov, M.; Grunze, M. J. Phys.: Condens. Matter 2001, 13, 11333.
43. Olsen, C.; Rowntree, P. A. J. Chem. Phys. 1998, 108, 3750.
44. Zharnikov, M.; Geyer, W.; Gölzhäuser, A.; Frey, S.; Grunze, M. Phys. Chem. Chem. Phys. 1999, 1, 3163.