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Volumn 2, Issue , 2004, Pages 1786-1793

Evolutionary recovery of electronic circuits from radiation induced faults

Author keywords

[No Author keywords available]

Indexed keywords

EVOLUTIONARY RECOVERY; FIELD PROGRAMMABLE TRANSISTOR ARRAYS (FPTA); SINGLE EVENT EFFECTS (SEE);

EID: 4344645178     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (8)

References (21)
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    • Anelli, G.;Trends in CMOS technologies and radiation tolerant design, Nuclear Science Symposium Conference Record, 2000 IEEE , Volume: 1, 15-20 Oct. 2000. Page(s): 2/2 vol.1
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  • 8
    • 77950944854 scopus 로고
    • Low dose rate radiation testing of advanced CMOS technology (AC/ACT) series parts for space flight applications
    • 1992. Workshop Record., 1992 IEEE, 14 July
    • Sharma, A.K.; Sahu, K.; Low dose rate radiation testing of advanced CMOS technology (AC/ACT) series parts for space flight applications,Radiation Effects Data Workshop, 1992. Workshop Record., 1992 IEEE, 14 July 1992, Page(s): 53-57
    • (1992) Radiation Effects Data Workshop , pp. 53-57
    • Sharma, A.K.1    Sahu, K.2
  • 9
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    • Radiation design test data for advanced CMOS product
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    • Maher, M.C.1
  • 10
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    • Hatano, H.1
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    • 0026961597 scopus 로고
    • Total dose radiation effects on the hardened CMOS/bulk and CMOS/SOS
    • 1991. RADECS 91., First European Conference on, 9-12 Sept.
    • Panxun Chen; Hongzhi Wu; Guanglun Li; Yunhan He; Peijen Li; Yi Mao; Total dose radiation effects on the hardened CMOS/bulk and CMOS/SOS, Radiation and its Effects on Devices and Systems, 1991. RADECS 91., First European Conference on, 9-12 Sept. 1991, Page(s): 249-253.
    • (1991) Radiation and Its Effects on Devices and Systems , pp. 249-253
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  • 12
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    • Gingrich, D.M.; Buchanan, N.J.; Chen, L.; Liu, S.;Ionizing radiation effects in EPF10K50E and XC2S150 programmable logic devices,Radiation Effects Data Workshop, 2002 IEEE, 15-19 July 2002,Page(s): 41-44.
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.