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Volumn 1, Issue , 2000, Pages
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Trends in CMOS technologies and radiation tolerant design
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NONE
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Author keywords
[No Author keywords available]
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Indexed keywords
FITS AND TOLERANCES;
HIGH ENERGY PHYSICS;
INTEGRATED CIRCUIT LAYOUT;
IONIZING RADIATION;
MEDICAL APPLICATIONS;
MOSFET DEVICES;
RADIATION EFFECTS;
RADIATION SHIELDING;
TECHNOLOGY TRANSFER;
ENERGETIC PARTICLES;
RADIATION RESPONSE;
RADIATION TOLERANT DESIGN;
SINGLE EVENT EFFECTS;
CMOS INTEGRATED CIRCUITS;
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EID: 0034593436
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
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Times cited : (2)
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References (0)
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