Total dose effect on two types of CMOS devices

International Conference on Solid-State and Integrated Circuit Technology Proceedings

Volumn , Issue , 1998, Pages 74-77

  Zhang, Zheng xuan ^a   Luo, Jin sheng ^a   Yuan, Ren feng ^a   He, Bao ping ^a   Jiang, Jing he ^a  

^a XI'AN JIAOTONG UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC INVERTERS; INTERFACES (MATERIALS); MOSFET DEVICES; THRESHOLD VOLTAGE;

TRANSFER-VOLTAGE SHIFT;

BIPOLAR INTEGRATED CIRCUITS;

EID: 0032226845     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (9)