Total ionizing dose effects in a SRAM-based FPGA

IEEE Radiation Effects Data Workshop

Volumn , Issue , 1999, Pages 24-29

  MacQueen, D M ^a   Gingrich, D M ^a   Buchanan, N J ^a   Green, P W ^a  

^a UNIVERSITY OF ALBERTA   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

DOSIMETRY; FIELD PROGRAMMABLE GATE ARRAYS; IONIZING RADIATION; IRRADIATION; RANDOM ACCESS STORAGE;

SINGLE EVENT EFFECT; SYNCHRONOUS RANDOM ACCESS STORAGE (SRAM);

RADIATION EFFECTS;

EID: 0033356126     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (20)