Single-event upset test results for the Xilinx XQ1701L PROM

IEEE Radiation Effects Data Workshop

Volumn , Issue , 1999, Pages 35-40

  Guertin, S M ^a   Swift, G M ^a   Nguyen, D ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FIELD PROGRAMMABLE GATE ARRAYS; RANDOM ACCESS STORAGE;

SINGLE EVENT EFFECT; SINGLE EVENT LATCHUP;

RADIATION EFFECTS;

EID: 0033323868     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (9)