Quantitative analysis of electronic properties of carbon nanotubes by scanning probe microscopy: From atomic to mesoscopic length scales

Physical Review Letters

Volumn 93, Issue 24, 2004, Pages

  Meunier, Vincent ^a   Kalinin, Sergei V ^a   Shin, Junsoo ^a,b   Baddorf, Arthur P ^a   Harrison, Robert J ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF TENNESSEE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CONTINUUM THEORY; IMAGE CHARGE MODEL; MESOSCOPIC LENGTH SCALES; SCANNING PROBE MICROSCOPY (SPM);

CHEMICAL ANALYSIS; CONTINUUM MECHANICS; ELECTRONIC PROPERTIES; NETWORKS (CIRCUITS); PROBABILITY DENSITY FUNCTION; SUBSTRATES; THERMAL EFFECTS;

CARBON NANOTUBES;

EID: 42749103428     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevLett.93.246801     Document Type: Article

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