Model for electrostatic screening by a semiconductor with free surface carriers

Physical Review B - Condensed Matter and Materials Physics

Volumn 66, Issue 23, 2002, Pages 2353101-2353109

  Krčmar, Maja R ^a   Saslow, Wayne M ^a  

^a TEXAS A AND M UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE; DENSITY; DIELECTRIC CONSTANT; ELECTRIC POTENTIAL; ELECTRICITY; POLARIZATION; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTOR; SURFACE PROPERTY; VACUUM;

EID: 0037115977     PISSN: 01631829     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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