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Volumn 1, Issue , 2006, Pages 145-151

Comparative wetting behavior of Sn-0.7Cu and Sn-0.7Cu-0.3Ni solders on Cu and Ni substrates

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONICS PACKAGING; ORGANIC ACIDS; SUBSTRATES; TIN METALLURGY; WETTING;

EID: 42549084218     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ESTC.2006.279992     Document Type: Conference Paper
Times cited : (12)

References (18)
  • 1
    • 0000757389 scopus 로고    scopus 로고
    • Morphology of interfacial reaction between lead-free solders and electroless Ni-P under bump metallization
    • Jang, J. W. et. al., "Morphology of interfacial reaction between lead-free solders and electroless Ni-P under bump metallization", Journal of Applied Physics, vol. 88, no. 11 (2000), pp. 6359-6363.
    • (2000) Journal of Applied Physics , vol.88 , Issue.11 , pp. 6359-6363
    • Jang, J.W.1    et., al.2
  • 2
    • 4544252482 scopus 로고    scopus 로고
    • Aging effects on fracture behavior of 63Sn37Pb eutectic solder during tensile tests under the SEM
    • Ding, Y. et. al., "Aging effects on fracture behavior of 63Sn37Pb eutectic solder during tensile tests under the SEM", Materials Science and Engineering A, vol. 384, no. 1-2 (2004), pp. 314-323.
    • (2004) Materials Science and Engineering A , vol.384 , Issue.1-2 , pp. 314-323
    • Ding, Y.1    et., al.2
  • 3
    • 11244336699 scopus 로고    scopus 로고
    • Characteristics of intermetallics and micromechanical properties during thermal ageing of Sn-Ag-Cu flip chip solder interconnects
    • Li, D. et. al., "Characteristics of intermetallics and micromechanical properties during thermal ageing of Sn-Ag-Cu flip chip solder interconnects", Materials Science and Engineering A, vol. 391, no. 1-2 (2005), pp. 95-103.
    • (2005) Materials Science and Engineering A , vol.391 , Issue.1-2 , pp. 95-103
    • Li, D.1    et., al.2
  • 4
    • 0037197312 scopus 로고    scopus 로고
    • Characterization of constitutive behavior SnAg, SnAgCu and SnPb solder in flip chip joints
    • Wiese, S. et. al., "Characterization of constitutive behavior SnAg, SnAgCu and SnPb solder in flip chip joints", Sensors and Actuators A, vol. 99, no. 1-2 (2002), pp. 188-193.
    • (2002) Sensors and Actuators A , vol.99 , Issue.1-2 , pp. 188-193
    • Wiese, S.1    et., al.2
  • 5
    • 0033534274 scopus 로고    scopus 로고
    • Interfacial reaction between Sn-1Bi-5In-9Zn solder and Cu substrate
    • Yoon, S. W. et. al., "Interfacial reaction between Sn-1Bi-5In-9Zn solder and Cu substrate", Scripta Materialia, vol. 40, no. 3 (1999), pp. 327-332.
    • (1999) Scripta Materialia , vol.40 , Issue.3 , pp. 327-332
    • Yoon, S.W.1    et., al.2
  • 6
    • 28844454324 scopus 로고    scopus 로고
    • Effects of Cu contents in Sn-Cu solder on the composition and morphology of intermetallic compounds at a solder/Ni interface
    • Yu, D. Q., et. al., "Effects of Cu contents in Sn-Cu solder on the composition and morphology of intermetallic compounds at a solder/Ni interface", Journal of Material Research, vol. 20, no. 8 (2005), pp. 2205-2212.
    • (2005) Journal of Material Research , vol.20 , Issue.8 , pp. 2205-2212
    • Yu, D.Q.1    et., al.2
  • 7
    • 18844382672 scopus 로고    scopus 로고
    • Interfacial reactions between Sn-0.4Cu solder and Cu substrate with or without ENIG plating layer during reflow reaction
    • Yoon, J. W. et. al., "Interfacial reactions between Sn-0.4Cu solder and Cu substrate with or without ENIG plating layer during reflow reaction", Journal of Alloys and Compounds, vol. 396, no. 1-2 (2005), pp. 122-127.
    • (2005) Journal of Alloys and Compounds , vol.396 , Issue.1-2 , pp. 122-127
    • Yoon, J.W.1    et., al.2
  • 8
    • 30844457287 scopus 로고    scopus 로고
    • Effects of process conditions on reliability, microstructure evolution and failure modes of SnAgCu solder joints
    • Arulvanan, P. et. al., "Effects of process conditions on reliability, microstructure evolution and failure modes of SnAgCu solder joints", Microelectronics Reliability, vol. 46, no. 2-4 (2006), pp. 432-439.
    • (2006) Microelectronics Reliability , vol.46 , Issue.2-4 , pp. 432-439
    • Arulvanan, P.1    et., al.2
  • 9
    • 4944243895 scopus 로고    scopus 로고
    • Intermetallic compound layer growth at the interface between Sn-Cu-Ni solder and Cu substrate
    • Yoon, J. W. et. al., "Intermetallic compound layer growth at the interface between Sn-Cu-Ni solder and Cu substrate", Journal of Alloys and Compounds, vol. 381, no. 1-2 (2004), pp. 151-157.
    • (2004) Journal of Alloys and Compounds , vol.381 , Issue.1-2 , pp. 151-157
    • Yoon, J.W.1    et., al.2
  • 10
    • 14644415469 scopus 로고    scopus 로고
    • Effect of rapid solidification and small additions of Zn and Bi on the structure and properties of Sn-Cu eutectic alloy
    • Ashram, T. E. et. al., "Effect of rapid solidification and small additions of Zn and Bi on the structure and properties of Sn-Cu eutectic alloy", Journal of Electronic Materials, vol. 34, no. 2 (2005), pp. 212-215.
    • (2005) Journal of Electronic Materials , vol.34 , Issue.2 , pp. 212-215
    • Ashram, T.E.1    et., al.2
  • 11
    • 0036738909 scopus 로고    scopus 로고
    • Wu, C. M, L. et. al., Microstructure and mechanical properties of new lead-free Sn-Cu-Re solder alloys, Journal of Electronic Materials, 31, no. 9 (2002), pp. 928-932.
    • Wu, C. M, L. et. al., "Microstructure and mechanical properties of new lead-free Sn-Cu-Re solder alloys", Journal of Electronic Materials, vol. 31, no. 9 (2002), pp. 928-932.
  • 13
    • 0037395107 scopus 로고    scopus 로고
    • Solderability testing of 95.5 Sn-3.9Ag-0.6Cu solder on oxygen-free high conductivity copper and Au-Ni-plated kovar
    • Lopez, E. P. et. al., "Solderability testing of 95.5 Sn-3.9Ag-0.6Cu solder on oxygen-free high conductivity copper and Au-Ni-plated kovar", Journal of Electronic Materials, vol. 32, no. 4 (2003), pp. 254-260.
    • (2003) Journal of Electronic Materials , vol.32 , Issue.4 , pp. 254-260
    • Lopez, E.P.1    et., al.2
  • 14
    • 0037326871 scopus 로고    scopus 로고
    • The wettability and microstructure of Sn-Zn-RE alloys
    • Wu, C. M. L. et. al., "The wettability and microstructure of Sn-Zn-RE alloys", Journal of Electronic Materials, vol. 32, no. 2 (2003), pp.63-69.
    • (2003) Journal of Electronic Materials , vol.32 , Issue.2 , pp. 63-69
    • Wu, C.M.L.1    et., al.2
  • 15
    • 24144493837 scopus 로고    scopus 로고
    • Wetting and reaction of Sn-2.8Ag-0.5Cu-1.0Bi solder with Cu and Ni substrates
    • Rizvi, M. J. et. al., "Wetting and reaction of Sn-2.8Ag-0.5Cu-1.0Bi solder with Cu and Ni substrates", Journal of Electronic Materials, vol. 34, no. 8 (2005), pp. 1115-1122.
    • (2005) Journal of Electronic Materials , vol.34 , Issue.8 , pp. 1115-1122
    • Rizvi, M.J.1    et., al.2
  • 16
    • 0032686512 scopus 로고    scopus 로고
    • Qualification of flip chip fluxes by wetting balance and surface insulation resistance tests
    • Tuominen, A. et. al., "Qualification of flip chip fluxes by wetting balance and surface insulation resistance tests", Soldering & Surface Mount Technology, vol.11, no. 1 (1999), pp.21-26.
    • (1999) Soldering & Surface Mount Technology , vol.11 , Issue.1 , pp. 21-26
    • Tuominen, A.1    et., al.2
  • 17
    • 0021565116 scopus 로고
    • Electrochemical Publications Ayr, Scotland
    • Wassink, R. J. K., Soldering in Electronics, Electrochemical Publications (Ayr, Scotland, 1984), pp. 154.
    • (1984) Soldering in Electronics , pp. 154
    • Wassink, R.J.K.1
  • 18
    • 84986052316 scopus 로고    scopus 로고
    • Vianco, P, T. et. al., Effect of substrate preheating on solderability performance as a guideline for assembly process development Part 1: Baseline analysis, Soldering & Surface Mount Technology, 8, no. 3 (1996), pp. 12-18.
    • Vianco, P, T. et. al., "Effect of substrate preheating on solderability performance as a guideline for assembly process development Part 1: Baseline analysis", Soldering & Surface Mount Technology, vol. 8, no. 3 (1996), pp. 12-18.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.