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Volumn 19, Issue 16, 2008, Pages

Coulomb blockade effects in silicon nanoparticles embedded in thin silicon-rich oxide films

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE MEASUREMENT; COULOMB BLOCKADE; LOW PRESSURE CHEMICAL VAPOR DEPOSITION; OXIDE FILMS; SEMICONDUCTOR MATERIALS; SILICA; SILICON;

EID: 42449154697     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/19/16/165401     Document Type: Article
Times cited : (16)

References (13)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.