Optical and structural properties of homoepitaxial ZnO

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6895, Issue , 2008, Pages

  Bartel, T P ^a   Wagner, M R ^a   Haboeck, U ^a   Hoffmann, A ^a   Neumann, C ^b   Lautenschlager S ^b   Sann, J ^b   Meyer, B K ^b  

^a TECHNISCHE UNIVERSITÄT BERLIN   (Germany)

^b JUSTUS LIEBIG UNIVERSITY   (Germany)

Author keywords

High resolution TEM; Homoepitaxy; Lattice constants; Raman scattering; Strain; Surface polarity; ZnO

Indexed keywords

ARCHITECTURAL ACOUSTICS; AUGER ELECTRON SPECTROSCOPY; CHEMICAL PROPERTIES; CHEMICAL VAPOR DEPOSITION; ELECTRON DEVICES; ELECTRON MICROSCOPES; ELECTRON MICROSCOPY; ELECTRON OPTICS; EPILAYERS; EPITAXIAL GROWTH; FULL WIDTH AT HALF MAXIMUM; HIGH RESOLUTION ELECTRON MICROSCOPY; IMAGING TECHNIQUES; METALLIZING; METALLORGANIC VAPOR PHASE EPITAXY; MICROSCOPIC EXAMINATION; NANOSTRUCTURED MATERIALS; OXIDES; PIGMENTS; SEMICONDUCTING ZINC COMPOUNDS; SEMICONDUCTOR QUANTUM WELLS; SPECTRUM ANALYSIS; STRUCTURAL PROPERTIES; SUBSTRATES; SURFACE PROPERTIES; TRANSMISSION ELECTRON MICROSCOPY; TWO DIMENSIONAL; ZINC; ZINC ALLOYS; ZINC OXIDE; ZINC SULFIDE;

(1 1 0) SURFACE; (2+1)-DIMENSIONAL; (PL) PROPERTIES; BOUND EXCITON (BEX); CHEMICAL VAPORS; EPI LAYERS; HALF MAXIMUM; HIGH QUALITY (HQ); HIGH RESOLUTIONS; HOMOEPITAXIAL; HOMOEPITAXIAL GROWTH; MICRO-RAMAN SPECTROSCOPY (MRS); NON-POLAR; OPTICAL (PET) (OPET); OXIDE MATERIALS; PHOTOLUMINESCENCE (PL) SPECTRUM; TRANSITION LINES;

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;

EID: 42249108520     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.775217     Document Type: Conference Paper

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