ZnO homoepitaxy

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5359, Issue , 2004, Pages 220-227

  Nause, J ^a   Ganesan, S ^a   Nemeth, B ^a  

^a Cermet Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BAND EDGE EMISSIONS; CRYSTAL QUALITY; MELT GROWTH TECHNIQUES; THIN FILM DEPOSITION;

DEPOSITION; EPITAXIAL GROWTH; METALLORGANIC CHEMICAL VAPOR DEPOSITION; PHOTOLUMINESCENCE; SILICON; THIN FILMS; X RAY ANALYSIS; ZINC OXIDE;

CRYSTALS;

EID: 4344600912     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.517230     Document Type: Conference Paper

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